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Helium Ion Microscopy

Principles and Applications, SpringerBriefs in Materials

Erschienen am 14.09.2013, 1. Auflage 2013
53,49 €
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Bibliografische Daten
ISBN/EAN: 9781461486596
Sprache: Englisch
Umfang: viii, 64 S., 13 s/w Illustr., 16 farbige Illustr.,
Einband: kartoniertes Buch

Beschreibung

InhaltsangabeChapter 1: Introduction to Helium Ion Microscopy Chapter 2: Microscopy with Ions  - A brief history Chapter 3: Operating the Helium Ion Microscope Chapter 4: Ion -Solid  Interactions  and Image Formation Chapter 5: Charging and  Damage Chapter 6: Microanalysis with the HIM Chapter 7: Ion Generated Damage Chapter 8: Working with other Ion beams Chapter 9: Patterning and Nanofabrication Conclusion Bibliography Appendix: iSE Yields,  and IONiSE  parameters for  He+ excitation  of Elements and Compounds Index